Featuring ESD, CDM and Latch-up test, Our company support every electrostatic destruction tester as well as test head.
ESD / CDM / Latch-up Tester |
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Photo |
Pin matrix |
Max voltage |
Vcc |
Test |
Model |
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int |
ext |
ESD |
CDM |
L-UP |
Measure |
Use |
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- |
4000V |
- |
- |
- |
○ |
- |
- |
IC LSI |
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64 |
- |
- |
3 |
- |
- |
○ |
- |
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8000V |
- |
- |
○ |
- |
- |
○ |
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128 256 |
8000V |
6 |
- |
○ |
○ |
○ |
○ |
High-pin-count Tester |
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Photo |
Pin matrix |
Max voltage |
Vcc |
Test |
Model |
|||||
int |
ext |
ESD |
CDM |
L-UP |
Measure |
Use |
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256 512 |
8000V |
6 |
4 |
OK |
- |
OK |
OK |
High-pin-count IC |
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512 1024 |
Photo |
Max voltage |
Test |
Model |
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ESD |
CDM |
TLP |
Measure |
Use |
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1000V |
OK |
- |
- |
OK |
MR head |
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4000V |
OK |
OK |
LEDIC |
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8000V |
- |
- |
|||||
4000V |
OK |
- |
- |
OK |
Wafer |
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Chip |
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4000V |
OK |
- |
- |
OK |
ElectronicsParts(LED) |
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8000V |
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4000V |
- |
- |
OK |
OK |
ElectronicsParts(IC) |
Model 4002/4012 | |
* Model 4002 is the first TLP test system in the world. * Damage detection by leakage current measurement after each pulse * Pulse Rise Time: 0.2ns, 2ns and 10ns(4002) /0.1ns, 0.2ns and 0.4ns(4012) |
Model 6200 | |
* High Voltage DV/DT Generator * Pulse voltage (DT): +/- 500V~2kV * Select of DV/DT: 1kV/us, 5kV/us, 10kV/us, 20kV/us, 30kV/us |