Ecdm Series is an inexpensive and manually controlled bench-top ESD simulator. By replacing an external probe or adaptor, every ESD event such as Human Body Model (HBM), Machine Model (MM) and Charged Device Model (CDM) including Field induced charge CDM (F-CDM) and Direct charge CDM (D-CDM) can be simulated.
If a Transmission Line Pulse (TLP) test configuration is requested, very high current V-I curve tracing as well as robustness test is done by narrow square pulse.Combining with wafer stage and manipulators, wafer level test may be done.
HBM, MM, D-CDM, F-CDM, TLP probes | |
[HBM or MM probe] | [CDM probe, XY stage] |
[AEC (ESDA) Air Discharge probe] | [Mobile charge measurement probe] |