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OPEN/SHORT TESTER ESPIER2001

ESPIER2001

There is a requirement of fast DC test such as open/short of any DUT pins, though complete performance test is not requested. Simplified test before and after burn-in, screening before the final test or before shipment are some of these examples. For this type of application, fast and inexpensive open/short tester is more suitable than the full DC tester that has plentiful test functions. Not only open/short test but a little more sophisticated test such as input leakage test, supply current test and write/read test of a specified memory location may be included.

Stand alone operation Simultaneous comparison by 4 analog comparators Long life and high reliability by semiconductor relays Constant current applied/voltage measurement test Easy connection with automated handler Easy pin expansion Easy programming and storage of test program Host PC controllable