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| DRAM Soft error tester |
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This is an application example of Interface Technology SR 5010 and SR 5020 VXI Digital Test Subsystem. System first writes known data in lots of DRAMs, then wait specified period repeatedly refreshed. When the specified period is expired, whole DRAMs are read and compared to the written data. If comparison errors are detected number of DRAM and memory address are saved as the soft error location. All soft errors are logged to the PC after the test. Radioactive ray such as alpha ,gamma-ray and neutron change data in any type of memory. This is called as soft error. Probability of soft errors will be increased by the memory integration. Because this system is built around VXI modules and not very large, it is easily moved to the top of mountain or deep underground, so that measurement at the different environment can be done. |
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Quantity of SR 5020, TTL I/O module is selected by the size of memory and number of memory. Following items are designed for the type and quantity of memory.
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