Open/Short Tester ESPIER-2001 Series

There is a requirement of fast DC test such as open/short of any DUT pins, though complete performance test is not requested.
Simplified IC test before and after burn-in, screening before the final test or before shipment are some of these examples.
For this type of application, fast and inexpensive open/short tester is more suitable than the full DC tester that has plentiful test functions.
ESPIER 2001 is suitable for such an application.

Not only open/short test but a little more sophisticated test such as input leakage test, supply current test and write/read test of a specified memory location may be included.

Features

• Stand alone operation
• Simultaneous comparison by 4 analog comparators
• Long life and high reliability by semiconductor relays
• Constant current applied/voltage measurement test
• Easy connection with automated handler
• Easy pin expansion
• Easy programming and storage of test program
• Host PC controllable