Transistor/FET Burn-in Tester with monitoring (Temperature stress is available)

Test & Measurement Technology

Burn-in Tester Model 6300A

Burn-in Tester Model 6300

The model 6300A is a burn-in and running tester of the semiconductor devices.

It records electrical data of all sample devices during the burn-in test for a very long time.

Features

  • 1 Unit: 10 channels
  • Maximum Gate Voltages/Bias Current: 15V/100mA
  • Maximum Drain Voltage/Bias Current: 100V/100mA
  • Maximum Test Time: About 8,000H
  • Option: Oven
  • Option: Additional Memory

 

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